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장비검색
장비명 FE-TEM 2
모델명 JEM-2100F HR
제조사 JEOL
보유기관 나노종합기술원
장비분류 측정
담당자 유정호
전화 042-366-1703

| 사양(구성및성능)


□ Accelerating vottage : 200kV

□ Point resolution : 0.23nm

□ Spherical aberration : 1.0㎜

□ Resolution of HAADF-STEM : 0.2nm

| 용도


□ The JEM-2100F (HR) is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a
next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and
pharmaceutical industries.